JPH079109Y2 - レーザダイオードの測定用治具 - Google Patents
レーザダイオードの測定用治具Info
- Publication number
- JPH079109Y2 JPH079109Y2 JP1988019525U JP1952588U JPH079109Y2 JP H079109 Y2 JPH079109 Y2 JP H079109Y2 JP 1988019525 U JP1988019525 U JP 1988019525U JP 1952588 U JP1952588 U JP 1952588U JP H079109 Y2 JPH079109 Y2 JP H079109Y2
- Authority
- JP
- Japan
- Prior art keywords
- laser diode
- pallet
- socket
- heat
- shaft portion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004020 conductor Substances 0.000 claims description 11
- 230000005855 radiation Effects 0.000 claims description 2
- 230000017525 heat dissipation Effects 0.000 description 32
- 238000003825 pressing Methods 0.000 description 11
- 230000006866 deterioration Effects 0.000 description 6
- 230000032683 aging Effects 0.000 description 5
- 230000010355 oscillation Effects 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 210000000078 claw Anatomy 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000002431 foraging effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000000191 radiation effect Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988019525U JPH079109Y2 (ja) | 1988-02-17 | 1988-02-17 | レーザダイオードの測定用治具 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988019525U JPH079109Y2 (ja) | 1988-02-17 | 1988-02-17 | レーザダイオードの測定用治具 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01124580U JPH01124580U (en]) | 1989-08-24 |
| JPH079109Y2 true JPH079109Y2 (ja) | 1995-03-06 |
Family
ID=31235112
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988019525U Expired - Lifetime JPH079109Y2 (ja) | 1988-02-17 | 1988-02-17 | レーザダイオードの測定用治具 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH079109Y2 (en]) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008153178A1 (ja) * | 2007-06-14 | 2008-12-18 | Chichibu Fuji Co., Ltd. | 半導体レーザ用エージングボード |
| JP5165541B2 (ja) * | 2008-11-21 | 2013-03-21 | ダイトロンテクノロジー株式会社 | 検査治具及び検査装置 |
| JP2010122181A (ja) * | 2008-11-21 | 2010-06-03 | Daitron Technology Co Ltd | 押さえ板及びそれを用いた検査装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58158372U (ja) * | 1982-04-19 | 1983-10-22 | 日本電気株式会社 | 半導体装置の測定治具 |
-
1988
- 1988-02-17 JP JP1988019525U patent/JPH079109Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01124580U (en]) | 1989-08-24 |
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